The device has been designed to protect embedded flash and SRAM with error-code correction (ECC) to provide the highest degree of reliability.
High energy particles and other environmental challenges can often be found in industrial settings presenting a danger of bombarding memory and creating bit flips during the normal course of operations of the device – especially when process nodes drop to 40nm and lower. This can potentially disrupt the operation of the MCU, producing incorrect or often dangerous results. To prevent dangers like these, the MAX32670 has been designed to protect its whole memory footprint (384kB flash and 128kB SRAM) with ECC to stop bit flips and enhance reliability. ECC detects single-bit errors corrects them through hardware, making it harder for bit-flip errors to have a detrimental effect on the application.
The MAX32670 uses only 40 µW/MHz of active power consumption and is able to execute commands from flash at 40 percent lower power than the closest competitive industrial solution. It has been designed to be the lowest power solution for battery-operated sensor applications. The MAX32670 MCU is available in a 1.8mm x 2.6mm WLP or a 5mm-x-5mm TQFN package - offering a 50 percent size reduction over its closest competitor.
“Bit flipping becomes a critical reliability concern as microcontrollers scale down to 40nm and below,” said Kris Ardis, executive director, Micros, Security and Software Business Unit at Maxim Integrated. “The MAX32670 is designed with a high degree of protection against these events so our customers have the reliability they can trust as they ready new systems in long lifetime and mission-critical applications.”
MAX32670 is available now from Maxim and the company’s authorized distributors. An evaluation kit for the MAX32670, the MAX32670EVKIT# is also available.