28 nm MCU with virtualization-assisted functions for automotive systems

February 20, 2019 //By Ally Winning
28 nm MCU with virtualization-assisted functions for automotive systems
Renesas has developed and verified the operation of an automotive test chip that will pave the way for automotive-control Flash MCUs employing a 28nm low-power process.

The MCU has four 600MHz CPUs with a lock-step mechanism and 16 MB Flash memory. The MCU also has virtualization-assisted functions enabling multiple software components to run on a single MCU without interference, satisfying ASIL D requirements. Enhanced BIST functionality also provides the MCU self-diagnostic fault-detection necessary to implement ASIL D, with a newly developed standby-resume BIST (SR-BIST) function executed during the standby-resume period. The test device also features enhanced networking functionality, including Gigabit Ethernet interface.

Renesas will present the test results in the session, “A 28nm 600MHz Automotive Flash Microcontroller with Virtualization-Assisted Processor for Next-Generation Automotive Architecture Complying with ISO26262 ASIL D,” on February 18 at International Solid-State Circuits Conference (ISSCC) 2019, February 17-21, 2019, in San Francisco.

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