BTI Mechanisms and Measurement Methodologies
By
Keithley Instruments / Semitracks
Download White Paper
This white paper describes the influence of device scaling on NBTI, the physical mechanisms involved, kinetic models, and explains its impact on device characteristics. In addition, the paper presents information on how recovery occurs under pulsed operation. Recovery is good news, because the lifetime of a device is longer under pulsed conditions, which is the case for most device and circuit applications. Read More
Disclaimer: by clicking on this button, you accept that your data might be communicated to this company. If you do not want us to communicate your data, please update your details on your profile
Download White PaperWhite Papers