BTI Mechanisms and Measurement Methodologies

By Keithley Instruments / Semitracks
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This white paper describes the influence of device scaling on NBTI, the physical mechanisms involved, kinetic models, and explains its impact on device characteristics. In addition, the paper presents information on how recovery occurs under pulsed operation. Recovery is good news, because the lifetime of a device is longer under pulsed conditions, which is the case for most device and circuit applications. Read More



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